Amel Chenouf, Boualem Djezzar, Abdelmadjid Benabadelmoumene, Hakim Tahi, Mohamed Goudjil. Reliability analysis of CMOS inverter subjected to AC & DC NBTI stresses. In 9th International Design and Test Symposium, IDT 2014, Algeries, Algeria, December 16-18, 2014. pages 142-146, IEEE, 2014. [doi]
Abstract is missing.