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Percolation theory applied to PZT thin films capacitors breakdown mechanisms

M. T. Chentir, J.-B. Jullien, B. Valtchanov, E. Bouyssou, L. Ventura, C. Anceau. Percolation theory applied to PZT thin films capacitors breakdown mechanisms. Microelectronics Reliability, 49(9-11):1074-1078, 2009. [doi]

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M. T. Chentir

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J.-B. Jullien

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B. Valtchanov

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E. Bouyssou

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L. Ventura

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C. Anceau

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