M. T. Chentir, J.-B. Jullien, B. Valtchanov, E. Bouyssou, L. Ventura, C. Anceau. Percolation theory applied to PZT thin films capacitors breakdown mechanisms. Microelectronics Reliability, 49(9-11):1074-1078, 2009. [doi]
@article{ChentirJVBVA09,
title = {Percolation theory applied to PZT thin films capacitors breakdown mechanisms},
author = {M. T. Chentir and J.-B. Jullien and B. Valtchanov and E. Bouyssou and L. Ventura and C. Anceau},
year = {2009},
doi = {10.1016/j.microrel.2009.07.048},
url = {http://dx.doi.org/10.1016/j.microrel.2009.07.048},
tags = {C++},
researchr = {https://researchr.org/publication/ChentirJVBVA09},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {49},
number = {9-11},
pages = {1074-1078},
}