Percolation theory applied to PZT thin films capacitors breakdown mechanisms

M. T. Chentir, J.-B. Jullien, B. Valtchanov, E. Bouyssou, L. Ventura, C. Anceau. Percolation theory applied to PZT thin films capacitors breakdown mechanisms. Microelectronics Reliability, 49(9-11):1074-1078, 2009. [doi]

Abstract

Abstract is missing.