Junho Cheon, Insoo Lee, Changyong Ahn, Milos Stanisavljevic, Aravinthan Athmanathan, Nikolaos Papandreou, Haris Pozidis, Evangelos Eleftheriou, Min Chul Shin, Taekseung Kim, Jong-Ho Kang, Jun Hyun Chun. Non-resistance metric based read scheme for multi-level PCRAM in 25 nm technology. In 2015 IEEE Custom Integrated Circuits Conference, CICC 2015, San Jose, CA, USA, September 28-30, 2015. pages 1-4, IEEE, 2015. [doi]
@inproceedings{CheonLASAPPESKK15,
title = {Non-resistance metric based read scheme for multi-level PCRAM in 25 nm technology},
author = {Junho Cheon and Insoo Lee and Changyong Ahn and Milos Stanisavljevic and Aravinthan Athmanathan and Nikolaos Papandreou and Haris Pozidis and Evangelos Eleftheriou and Min Chul Shin and Taekseung Kim and Jong-Ho Kang and Jun Hyun Chun},
year = {2015},
doi = {10.1109/CICC.2015.7338358},
url = {http://dx.doi.org/10.1109/CICC.2015.7338358},
researchr = {https://researchr.org/publication/CheonLASAPPESKK15},
cites = {0},
citedby = {0},
pages = {1-4},
booktitle = {2015 IEEE Custom Integrated Circuits Conference, CICC 2015, San Jose, CA, USA, September 28-30, 2015},
publisher = {IEEE},
isbn = {978-1-4799-8682-8},
}