Junho Cheon, Insoo Lee, Changyong Ahn, Milos Stanisavljevic, Aravinthan Athmanathan, Nikolaos Papandreou, Haris Pozidis, Evangelos Eleftheriou, Min Chul Shin, Taekseung Kim, Jong-Ho Kang, Jun Hyun Chun. Non-resistance metric based read scheme for multi-level PCRAM in 25 nm technology. In 2015 IEEE Custom Integrated Circuits Conference, CICC 2015, San Jose, CA, USA, September 28-30, 2015. pages 1-4, IEEE, 2015. [doi]
Abstract is missing.