Comparison of supply noise and substrate noise reduction in SiGe BiCMOS and FDSOI processes

Wai Leng Cheong, Brian Owens, Hui En Pham, Christopher Hanken, Jim Le, Terri S. Fiez, Kartikeya Mayaram. Comparison of supply noise and substrate noise reduction in SiGe BiCMOS and FDSOI processes. In 10th International Symposium on Quality of Electronic Design (ISQED 2009), 16-18 March 2009, San Jose, CA, USA. pages 112-115, IEEE, 2009. [doi]

Abstract

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