Vladimir Chepelev, Yury Parfenov, William Radasky, Boris Titov, Leonid Zdoukhov, Kejie Li, Yuhao Chen, Xu Kong, Yan-zhao Xie. Methodical Approach for Immunity Assessment of Electronic Devices Excited by High Power EMP. J. Electronic Testing, 34(5):547-557, 2018. [doi]
Abstract is missing.