Natalia Cherezova, Salvatore Pappalardo, Annachiara Ruospo, Bastien Deveautour, Lorenzo Fezza, Artur Jutman, Ernesto Sánchez 0001, Alberto Bosio, Matteo Sonza Reorda, Maksim Jenihhin. Special Session: Reliability Assessment of DNN Models and Inference on Systolic Arrays. In 44th IEEE VLSI Test Symposium, VTS 2026, Napa, CA, USA, April 27-29, 2026. pages 1-10, IEEE, 2026. [doi]
Abstract is missing.