Mason Chern, Shih-Wei Lee, Shi-Yu Huang, Yu Huang, Gaurav Veda, Kun-Han Hans Tsai, Wu-Tung Cheng. Improving scan chain diagnostic accuracy using multi-stage artificial neural networks. In Toshiyuki Shibuya, editor, Proceedings of the 24th Asia and South Pacific Design Automation Conference, ASPDAC 2019, Tokyo, Japan, January 21-24, 2019. pages 341-346, ACM, 2019. [doi]
@inproceedings{ChernLHHVTC19,
title = {Improving scan chain diagnostic accuracy using multi-stage artificial neural networks},
author = {Mason Chern and Shih-Wei Lee and Shi-Yu Huang and Yu Huang and Gaurav Veda and Kun-Han Hans Tsai and Wu-Tung Cheng},
year = {2019},
doi = {10.1145/3287624.3287692},
url = {https://doi.org/10.1145/3287624.3287692},
researchr = {https://researchr.org/publication/ChernLHHVTC19},
cites = {0},
citedby = {0},
pages = {341-346},
booktitle = {Proceedings of the 24th Asia and South Pacific Design Automation Conference, ASPDAC 2019, Tokyo, Japan, January 21-24, 2019},
editor = {Toshiyuki Shibuya},
publisher = {ACM},
isbn = {978-1-4503-6007-4},
}