Mason Chern, Shih-Wei Lee, Shi-Yu Huang, Yu Huang 0005, Gaurav Veda, Kun-Han Tsai, Wu-Tung Cheng. Diagnosis of Intermittent Scan Chain Faults Through a Multistage Neural Network Reasoning Process. IEEE Trans. on CAD of Integrated Circuits and Systems, 39(10):3044-3055, 2020. [doi]
Abstract is missing.