Metric learning by directly minimizing the k-NN training error

Konstantin Chernoff, Marco Loog, Mads Nielsen. Metric learning by directly minimizing the k-NN training error. In Proceedings of the 21st International Conference on Pattern Recognition, ICPR 2012, Tsukuba, Japan, November 11-15, 2012. pages 1265-1268, IEEE, 2012. [doi]

Abstract

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