A high-resolution jitter measurement technique using ADC sampling - researchr publication

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Sasikumar Cherubal, Abhijit Chatterjee. A high-resolution jitter measurement technique using ADC sampling. In Proceedings IEEE International Test Conference 2001, Baltimore, MD, USA, 30 October - 1 November 2001. pages 838-847, IEEE Computer Society, 2001.

Abstract is missing.

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