Generating Test Patterns for Bridge Faults in CMOS ICs

Brian Chess, Tracy Larrabee. Generating Test Patterns for Bridge Faults in CMOS ICs. In Robert Werner, editor, EDAC - The European Conference on Design Automation, ETC - European Test Conference, EUROASIC - The European Event in ASIC Design, Proceedings, February 28 - March 3, 1994, Paris, France. pages 165-170, IEEE Computer Society, 1994.

Abstract

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