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Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education

Moi-Tin Chew, Serge Demidenko, Melanie Po-Leen Ooi, Ye Chow Kuang. Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education. In IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, CIVEMSA 2017, Annecy, France, June 26-28, 2017. pages 165-170, IEEE, 2017. [doi]

Authors

Moi-Tin Chew

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Serge Demidenko

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Melanie Po-Leen Ooi

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Ye Chow Kuang

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