Moi-Tin Chew, Serge Demidenko, Melanie Po-Leen Ooi, Ye Chow Kuang. Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education. In IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, CIVEMSA 2017, Annecy, France, June 26-28, 2017. pages 165-170, IEEE, 2017. [doi]
@inproceedings{ChewDOK17,
title = {Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education},
author = {Moi-Tin Chew and Serge Demidenko and Melanie Po-Leen Ooi and Ye Chow Kuang},
year = {2017},
doi = {10.1109/CIVEMSA.2017.7995320},
url = {https://doi.org/10.1109/CIVEMSA.2017.7995320},
researchr = {https://researchr.org/publication/ChewDOK17},
cites = {0},
citedby = {0},
pages = {165-170},
booktitle = {IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, CIVEMSA 2017, Annecy, France, June 26-28, 2017},
publisher = {IEEE},
isbn = {978-1-5090-4253-1},
}