Moi-Tin Chew, Serge Demidenko, Melanie Po-Leen Ooi, Ye Chow Kuang. Family of low-cost NI ELVIS/LabVIEW-based semiconductor testers for engineering education. In IEEE International Conference on Computational Intelligence and Virtual Environments for Measurement Systems and Applications, CIVEMSA 2017, Annecy, France, June 26-28, 2017. pages 165-170, IEEE, 2017. [doi]
Abstract is missing.