Embedded Trace: A Key Enabler for Silicon Lifecycle Management

Vivek Chickermane, Marcel Zak, Mat O'Donnell. Embedded Trace: A Key Enabler for Silicon Lifecycle Management. In IEEE International Test Conference, ITC 2025, San Diego, CA, USA, September 20-26, 2025. pages 550-553, IEEE, 2025. [doi]

Abstract

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