Nguyen Dang Chien, Chun-Hsing Shih, Luu The Vinh, Nguyen Van Kien. Quantum confinement effect in strained-Si1-xGex double-gate tunnel field-effect transistors. In Proceedings of 2013 International Conference on IC Design & Technology, ICICDT 2013, Pavia, Italy, May 29-31, 2013. pages 73-76, IEEE, 2013. [doi]
@inproceedings{ChienSVK13,
title = {Quantum confinement effect in strained-Si1-xGex double-gate tunnel field-effect transistors},
author = {Nguyen Dang Chien and Chun-Hsing Shih and Luu The Vinh and Nguyen Van Kien},
year = {2013},
doi = {10.1109/ICICDT.2013.6563306},
url = {http://dx.doi.org/10.1109/ICICDT.2013.6563306},
researchr = {https://researchr.org/publication/ChienSVK13},
cites = {0},
citedby = {0},
pages = {73-76},
booktitle = {Proceedings of 2013 International Conference on IC Design & Technology, ICICDT 2013, Pavia, Italy, May 29-31, 2013},
publisher = {IEEE},
isbn = {978-1-4673-4740-2},
}