Cary K. Chin, Edward J. McCluskey. Test Length for Pseudo Random Testing. In Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985. pages 94-99, IEEE Computer Society, 1985.
@inproceedings{ChinM85,
title = {Test Length for Pseudo Random Testing},
author = {Cary K. Chin and Edward J. McCluskey},
year = {1985},
tags = {testing, random testing},
researchr = {https://researchr.org/publication/ChinM85},
cites = {0},
citedby = {0},
pages = {94-99},
booktitle = {Proceedings International Test Conference 1985, Philadelphia, PA, USA, November 1985},
publisher = {IEEE Computer Society},
}