Ching-Yu Chin, Yao-Te Tsou, Chi-Min Chang, Mango Chia-Tso Chao. A novel test flow for one-time-programming applications of NROM technology. In Gordon W. Roberts, Bill Eklow, editors, 2009 IEEE International Test Conference, ITC 2009, Austin, TX, USA, November 1-6, 2009. pages 1-9, IEEE, 2009. [doi]
Abstract is missing.