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Traps localization and analysis in GaN HEMTs

Alessandro Chini, Fabio Soci, Gaudenzio Meneghesso, Matteo Meneghini, Enrico Zanoni. Traps localization and analysis in GaN HEMTs. Microelectronics Reliability, 54(9-10):2222-2226, 2014. [doi]

Authors

Alessandro Chini

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Fabio Soci

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Gaudenzio Meneghesso

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Matteo Meneghini

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Enrico Zanoni

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