Traps localization and analysis in GaN HEMTs

Alessandro Chini, Fabio Soci, Gaudenzio Meneghesso, Matteo Meneghini, Enrico Zanoni. Traps localization and analysis in GaN HEMTs. Microelectronics Reliability, 54(9-10):2222-2226, 2014. [doi]

Abstract

Abstract is missing.