Alessandro Chini, Fabio Soci, Gaudenzio Meneghesso, Matteo Meneghini, Enrico Zanoni. Traps localization and analysis in GaN HEMTs. Microelectronics Reliability, 54(9-10):2222-2226, 2014. [doi]
@article{ChiniSMMZ14,
title = {Traps localization and analysis in GaN HEMTs},
author = {Alessandro Chini and Fabio Soci and Gaudenzio Meneghesso and Matteo Meneghini and Enrico Zanoni},
year = {2014},
doi = {10.1016/j.microrel.2014.07.085},
url = {http://dx.doi.org/10.1016/j.microrel.2014.07.085},
researchr = {https://researchr.org/publication/ChiniSMMZ14},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {54},
number = {9-10},
pages = {2222-2226},
}