Lih-Yih Chiou, Chi-Ray Huang, Chang-Chieh Cheng, Jing-Yu Huang, Wei-Suo Ling. A Variation-Tolerant Bitline Leakage Sensing Scheme for Near-Threshold SRAMs. In International Symposium on VLSI Design, Automation and Test, VLSI-DAT 2019, Hsinchu, Taiwan, April 22-25, 2019. pages 1-4, IEEE, 2019. [doi]
Abstract is missing.