2 layers using dynamic measurement protocols

Philippe Chiquet, Pascal Masson, Romain Laffont, Gilles Micolau, Jérémy Postel-Pellerin, Frédéric Lalande, Bernard Bouteille, Jean-Luc Ogier. 2 layers using dynamic measurement protocols. Microelectronics Reliability, 52(9-10):1895-1900, 2012. [doi]

@article{ChiquetMLMPLBO12,
  title = {2 layers using dynamic measurement protocols},
  author = {Philippe Chiquet and Pascal Masson and Romain Laffont and Gilles Micolau and Jérémy Postel-Pellerin and Frédéric Lalande and Bernard Bouteille and Jean-Luc Ogier},
  year = {2012},
  doi = {10.1016/j.microrel.2012.06.124},
  url = {http://dx.doi.org/10.1016/j.microrel.2012.06.124},
  researchr = {https://researchr.org/publication/ChiquetMLMPLBO12},
  cites = {0},
  citedby = {0},
  journal = {Microelectronics Reliability},
  volume = {52},
  number = {9-10},
  pages = {1895-1900},
}