I-Wei Chiu, Xin-Ping Chen, Jennifer Shueh-Inn Hu, James Chien-Mo Li. Automatic Test Configuration and Pattern Generation (ATCPG) for Neuromorphic Chips. In Tulika Mitra, Evangeline Young, Jinjun Xiong, editors, Proceedings of the 41st IEEE/ACM International Conference on Computer-Aided Design, ICCAD 2022, San Diego, California, USA, 30 October 2022 - 3 November 2022. ACM, 2022. [doi]
Abstract is missing.