Sau-Kwo Chiu, Jen-Chieh Yeh, Chih-Tsun Huang, Cheng-Wen Wu. Diagonal Test and Diagnostic Schemes for Flash Memorie. In Proceedings IEEE International Test Conference 2002, Baltimore, MD, USA, October 7-10, 2002. pages 37-46, IEEE Computer Society, 2002. [doi]
Abstract is missing.