Yonsang Cho, Irith Pomeranz, Sudhakar M. Reddy. Test Application Time Reduction for Scan Circuits Using Limited Scan Operations. In 5th International Symposium on Quality of Electronic Design (ISQED 2004), 22-24 March 2004, San Jose, CA, USA. pages 211-216, IEEE Computer Society, 2004. [doi]
Abstract is missing.