KAST: K-associative sector translation for NAND flash memory in real-time systems

Hyun-jin Cho, Dongkun Shin, Young Ik Eom. KAST: K-associative sector translation for NAND flash memory in real-time systems. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 507-512, IEEE, 2009. [doi]

Authors

Hyun-jin Cho

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Dongkun Shin

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Young Ik Eom

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