Hyun-jin Cho, Dongkun Shin, Young Ik Eom. KAST: K-associative sector translation for NAND flash memory in real-time systems. In Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009. pages 507-512, IEEE, 2009. [doi]
@inproceedings{ChoSE09,
title = {KAST: K-associative sector translation for NAND flash memory in real-time systems},
author = {Hyun-jin Cho and Dongkun Shin and Young Ik Eom},
year = {2009},
url = {http://ieeexplore.ieee.org/xpls/abs_all.jsp?isnumber=5090609&arnumber=5090717&count=326&index=103},
tags = {translation},
researchr = {https://researchr.org/publication/ChoSE09},
cites = {0},
citedby = {0},
pages = {507-512},
booktitle = {Design, Automation and Test in Europe, DATE 2009, Nice, France, April 20-24, 2009},
publisher = {IEEE},
}