Minki Cho, Nikhil Sathe, Arijit Raychowdhury, Saibal Mukhopadhyay. Optimization of burn-in test for many-core processors through adaptive spatiotemporal power migration. In Ron Press, Erik H. Volkerink, editors, 2011 IEEE International Test Conference, ITC 2010, Austin, TX, USA, November 2-4, 2010. pages 59-68, IEEE, 2010. [doi]
Abstract is missing.