Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices

Seongjae Cho, Jang-Gn Yun, Il Han Park, Jung Hoon Lee, Jong-Pil Kim, Jong Duk Lee, Hyungcheol Shin, Byung-Gook Park. Analyses on Current Characteristics of 3-D MOSFET Determined by Junction Doping Profiles for Nonvolatile Memory Devices. IEICE Transactions, 90-C(5):988-993, 2007. [doi]

Abstract

Abstract is missing.