Jung Hwan Choi, Aditya Bansal, Mesut Meterelliyoz, Jayathi Murthy, Kaushik Roy. Leakage power dependent temperature estimation to predict thermal runaway in FinFET circuits. In Soha Hassoun, editor, 2006 International Conference on Computer-Aided Design (ICCAD 06), November 5-9, 2006, San Jose, CA, USA. pages 583-586, ACM, 2006. [doi]
Abstract is missing.