Formal Specification Based Automatic Test Generation for Embedded Network Systems - researchr publication authors

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Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, Hitoshi Ohsaki. Formal Specification Based Automatic Test Generation for Embedded Network Systems. J. Applied Mathematics, 2014, 2014. [doi]

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