Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, Hitoshi Ohsaki. Formal Specification Based Automatic Test Generation for Embedded Network Systems. J. Applied Mathematics, 2014, 2014. [doi]
@article{ChoiNATAYMO14,
title = {Formal Specification Based Automatic Test Generation for Embedded Network Systems},
author = {Eun-Hye Choi and Hideaki Nishihara and Takahiro Ando and Nguyen Van Tang and Masahiro Aoki and Keiichi Yoshisaka and Osamu Mizuno and Hitoshi Ohsaki},
year = {2014},
doi = {10.1155/2014/909762},
url = {http://dx.doi.org/10.1155/2014/909762},
researchr = {https://researchr.org/publication/ChoiNATAYMO14},
cites = {0},
citedby = {0},
journal = {J. Applied Mathematics},
volume = {2014},
}