Formal Specification Based Automatic Test Generation for Embedded Network Systems

Eun-Hye Choi, Hideaki Nishihara, Takahiro Ando, Nguyen Van Tang, Masahiro Aoki, Keiichi Yoshisaka, Osamu Mizuno, Hitoshi Ohsaki. Formal Specification Based Automatic Test Generation for Embedded Network Systems. J. Applied Mathematics, 2014, 2014. [doi]

References

No references recorded for this publication.

Cited by

No citations of this publication recorded.