Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost - researchr publication authors

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Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang. Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost. IEEE Transactions on Computers, 67(12):1835-1839, 2018. [doi]

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