Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang. Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost. IEEE Transactions on Computers, 67(12):1835-1839, 2018. [doi]
@article{ChoiOLK18,
title = {Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost},
author = {Inhyuk Choi and Hyunggoy Oh and Young-Woo Lee and Sungho Kang},
year = {2018},
doi = {10.1109/TC.2018.2835462},
url = {http://doi.ieeecomputersociety.org/10.1109/TC.2018.2835462},
researchr = {https://researchr.org/publication/ChoiOLK18},
cites = {0},
citedby = {0},
journal = {IEEE Transactions on Computers},
volume = {67},
number = {12},
pages = {1835-1839},
}