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Inhyuk Choi, Hyunggoy Oh, Young-Woo Lee, Sungho Kang. Test Resource Reused Debug Scheme to Reduce the Post-Silicon Debug Cost. IEEE Transactions on Computers, 67(12):1835-1839, 2018. [doi]
Possibly Related PublicationsThe following publications are possibly variants of this publication: An On-Chip Error Detection Method to Reduce the Post-Silicon Debug TimeHyunggoy Oh, Taewoo Han, Inhyuk Choi, Sungho Kang. TC, 66(1):38-44, 2017. [doi]
The following publications are possibly variants of this publication: