Seung Hoon Choi, Bipul Chandra Paul, Kaushik Roy. Novel sizing algorithm for yield improvement under process variation in nanometer technology. In Sharad Malik, Limor Fix, Andrew B. Kahng, editors, Proceedings of the 41th Design Automation Conference, DAC 2004, San Diego, CA, USA, June 7-11, 2004. pages 454-459, ACM, 2004. [doi]
Abstract is missing.