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MAEPER: Matching Access and Error Patterns With Error-Free Resource for Low Vcc L1 Cache

Young-Geun Choi, Sungjoo Yoo, Sunggu Lee, Jung Ho Ahn, Kangmin Lee. MAEPER: Matching Access and Error Patterns With Error-Free Resource for Low Vcc L1 Cache. IEEE Trans. VLSI Syst., 21(6):1013-1026, 2013. [doi]

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