Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory

Jin Hyung Choi, Chong-Gun Yu, Jong-Tae Park. Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. Microelectronics Reliability, 64:215-219, 2016. [doi]

Authors

Jin Hyung Choi

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Chong-Gun Yu

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Jong-Tae Park

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