Jin Hyung Choi, Chong-Gun Yu, Jong-Tae Park. Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. Microelectronics Reliability, 64:215-219, 2016. [doi]
@article{ChoiYP16,
title = {Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory},
author = {Jin Hyung Choi and Chong-Gun Yu and Jong-Tae Park},
year = {2016},
doi = {10.1016/j.microrel.2016.07.039},
url = {http://dx.doi.org/10.1016/j.microrel.2016.07.039},
researchr = {https://researchr.org/publication/ChoiYP16},
cites = {0},
citedby = {0},
journal = {Microelectronics Reliability},
volume = {64},
pages = {215-219},
}