Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory

Jin Hyung Choi, Chong-Gun Yu, Jong-Tae Park. Nanowire width dependence of data retention and endurance characteristics in nanowire SONOS flash memory. Microelectronics Reliability, 64:215-219, 2016. [doi]

Abstract

Abstract is missing.