Electromagnetic Interference Caused by Parasitic Electric-line Current on a Digital Module in a Closed Cabinet

Jaeyul Choo, Jong-Eon Park, Hosung Choo, Yong-Hwa Kim. Electromagnetic Interference Caused by Parasitic Electric-line Current on a Digital Module in a Closed Cabinet. IEEE Access, 7:59806-59812, 2019. [doi]

Authors

Jaeyul Choo

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Jong-Eon Park

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Hosung Choo

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Yong-Hwa Kim

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