Electromagnetic Interference Caused by Parasitic Electric-line Current on a Digital Module in a Closed Cabinet

Jaeyul Choo, Jong-Eon Park, Hosung Choo, Yong-Hwa Kim. Electromagnetic Interference Caused by Parasitic Electric-line Current on a Digital Module in a Closed Cabinet. IEEE Access, 7:59806-59812, 2019. [doi]

Abstract

Abstract is missing.