Jaeyul Choo, Jong-Eon Park, Hosung Choo, Yong-Hwa Kim. Electromagnetic Interference Caused by Parasitic Electric-line Current on a Digital Module in a Closed Cabinet. IEEE Access, 7:59806-59812, 2019. [doi]
@article{ChooPCK19,
title = {Electromagnetic Interference Caused by Parasitic Electric-line Current on a Digital Module in a Closed Cabinet},
author = {Jaeyul Choo and Jong-Eon Park and Hosung Choo and Yong-Hwa Kim},
year = {2019},
doi = {10.1109/ACCESS.2019.2914126},
url = {https://doi.org/10.1109/ACCESS.2019.2914126},
researchr = {https://researchr.org/publication/ChooPCK19},
cites = {0},
citedby = {0},
journal = {IEEE Access},
volume = {7},
pages = {59806-59812},
}