A 22nm 96KX144 RRAM Macro with a Self-Tracking Reference and a Low Ripple Charge Pump to Achieve a Configurable Read Window and a Wide Operating Voltage Range

Chung-Cheng Chou, Zheng-Jun Lin, Chien-An Lai, Chin-I Su, Pei-Ling Tseng, Wei-Chi Chen, Wu-Chin Tsai, Wen-Ting Chu, Tong-Chern Ong, Harry Chuang, Yu-Der Chih, Tsung-Yung Jonathan Chang. A 22nm 96KX144 RRAM Macro with a Self-Tracking Reference and a Low Ripple Charge Pump to Achieve a Configurable Read Window and a Wide Operating Voltage Range. In IEEE Symposium on VLSI Circuits, VLSI Circuits 2020, Honolulu, HI, USA, June 16-19, 2020. pages 1-2, IEEE, 2020. [doi]

Authors

Chung-Cheng Chou

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Zheng-Jun Lin

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Chien-An Lai

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Chin-I Su

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Pei-Ling Tseng

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Wei-Chi Chen

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Wu-Chin Tsai

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Wen-Ting Chu

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Tong-Chern Ong

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Harry Chuang

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Yu-Der Chih

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Tsung-Yung Jonathan Chang

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