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Y. C. Chou, D. Leung, I. Smorchkova, M. Wojtowicz, R. Grundbacher, L. Callejo, Q. Kan, R. Lai, P. H. Liu, D. Eng. Degradation of AlGaN/GaN HEMTs under elevated temperature lifetesting. Microelectronics Reliability, 44(7):1033-1038, 2004. [doi]